The analysis of the characteristic losses's nature
occurrence of electron energy on a surface of metals Cu and Pd
М.А.Vasylyev1,
V.A Tinkov1(*), A.A.Tinkova1,2
1 G. V. Kurdyumov
Institute for Metal Physics,
1,2
*E-mail: sheyh@imp.kiev.ua
The nature of occurrence of electron’s energy characteristic losses in secondary
electron’s issue spectra from surfaces of metals Cu, Pd and alloy Cu75Pd25 (100) in a
low-energy range of energy of primary electrons Е0 was investigated. The
basic types of losses are revealed: superficial and volumetric plasmotrons
and their
hybrid mode, interband transition and ionization losses. It was revealed, that
for Cu, Pd and alloy Cu75Pd25 (100)
experimental values of plasmotron’s energy are localized at smaller energies, than the
theory of free electronic gas predicts. It is established, that presence of dispersion
at plasma fluctuations is caused by complex electronic structure and
heterogeneity of electronic condition's density in near-surface
layer.
Not destroying level-by-level analysis of alloy Cu75Pd25 (100) with
application of ionization spectroscopy which allows to define dependence of
concentration of elements on depth of sounding by primary electrons [1] was lead. It is
established, that ordered alloy Cu75Pd25 (100) has oscillating on depth a concentration
profile. The structure of odd nuclear layers is close to 50 % Cu on 50 % Pd, and even layers
consist from pure Cu. The method of diffraction of slow electrons on a surface of
an alloy had been found out a superstructural lattice with (2х2).
In the presented work for alloy Cu75Pd25 (100) correlation
between change and attenuation of intensity of superficial and volumetric plasmotron’s lines with
results of not destroying level-by-level analysis of alloy's surface structure
has been found out. It is established, that under the attitude of intensityes
lines of superficial and volumetric R plasmones depending on energies Е0 for alloy Cu75Pd25 (100) it is possible to
define boundary surface-volume [2].
[1] M.A. Vasylyev, V.A. Tinkov et al., Appl. Surf. Sci. 253: 1081 (2006).
[2] M.A.
Vasylyev, V.A. Tinkov et al., J. Electron. Spectrosc. Rel. Phenom., 159: 53
(2007).